Methods for testing optical path bit errors during the acceptance of WDM devices

1. During the system commissioning of devices in back-to-back mode, use pigtails to respectively connect the Rx and Tx ports of the TQX board on the front subrack to the Tx and Rx ports of the corresponding board on the rear subrack.
2. Connect the Rx and Tx ports of the TDX board in the rear subrack at the central site to form a loopback.
3. Connect test instruments to the TI and RO ports of the TDX board on another subrack at the central site to cover most of the paths after the 24-hour bit error test.
4. If another wavelength needs to be tested, connect multiple wavelengths according to the SDH connecting method.

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